Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power

I. Fodchuk; A. Kuzmin; V. Dovganyuk; S. Balovsyak; I. Hutsuliak; M. Solodkyi; D. Makotiak; O. Tkach

doi:10.1117/12.3015876

5 January 2024 Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power

I. Fodchuk, A. Kuzmin, V. Dovganyuk, S. Balovsyak, I. Hutsuliak, M. Solodkyi, D. Makotiak, O. Tkach

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Proceedings Volume 12938, Sixteenth International Conference on Correlation Optics; 129382G (2024) https://doi.org/10.1117/12.3015876
Event: International Conference Correlation Optics (COR 2023), 2023, Chernivtsi, Ukraine

Abstract

Chlorine doped CdTe single crystals (CdTe:Cl) were grown by the travelling heater method. The defect structure of the obtained single crystals was investigated using high-resolution X-ray diffractometry. The optimized models of dislocation systems based on the Thompson tetrahedron were constructed for CdTe:Cl single crystals. The analysis of the intensity distribution of diffracted X-rays as a function of reciprocal space coordinates and rocking curves was carried out using the kinematic theory of X-ray scattering in real crystals. The comparative analysis of experimental and theoretically predicted values of helical dislocation densities for CdTe:Cl crystals with perfect and mosaic structures were carried out. The dynamics of changes in concentrations and sizes of several types of interconnected dominant defects (spherical and disc-shaped clusters, dislocation loops) were studied with total integral reflectivity method. The generalized dynamic theory of X-ray diffraction in real crystals with randomly distributed microdefects of various types and a disturbed near-surface layer was used to interpret the experimental data.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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I. Fodchuk, A. Kuzmin, V. Dovganyuk, S. Balovsyak, I. Hutsuliak, M. Solodkyi, D. Makotiak, and O. Tkach "Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power", Proc. SPIE 12938, Sixteenth International Conference on Correlation Optics, 129382G (5 January 2024); https://doi.org/10.1117/12.3015876

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KEYWORDS

Crystals

X-rays

X-ray diffraction

Systems modeling

Reflection

Scattering

Diffraction

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