The influence of the transition layer of CdTe:Cl/MoOx heterostructures on the electrical and spectroscopic properties of detector systems

I. Fodchuk; A. Kuzmin; S. Balovsyak; I. Hutsuliak; M. Solodkyi; O. Maslynchuk

doi:10.1117/12.3015878

5 January 2024 The influence of the transition layer of CdTe:Cl/MoO_x heterostructures on the electrical and spectroscopic properties of detector systems

I. Fodchuk, A. Kuzmin, S. Balovsyak, I. Hutsuliak, M. Solodkyi, O. Maslynchuk

Author Affiliations +

Proceedings Volume 12938, Sixteenth International Conference on Correlation Optics; 129382H (2024) https://doi.org/10.1117/12.3015878
Event: International Conference Correlation Optics (COR 2023), 2023, Chernivtsi, Ukraine

Abstract

The comparative analysis of experimental and theoretically predicted values of helical dislocation densities for CdTe:Cl and MoOx/CdTe:Cl crystals with perfect and mosaic structures were carried out. Two-fold increase in the dislocation concentration was found for MoOx/CdTe:Cl heterostructures as a result of compression deformations of the CdTe:Cl crystal lattice. The transitional deformed layer at the boundary between MoOx film and CdTe:Cl single crystal with a thickness of about 0.1 μm significantly affects the electrical and spectroscopic properties of the obtained systems as materials for γ-radiation detection. Typical square-root type of the reverse branch of current-voltage characteristics were measured for a heterostructures based on a perfect CdTe:Cl, when for MoOx/CdTe:Cl heterostructures based on a mosaic substrate, an atypical quasi-linear type of I(V) dependence is observed. The characteristics of the detectors are affected not only by the quality of the initial crystals, but also by the technology of their post-treatment.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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I. Fodchuk, A. Kuzmin, S. Balovsyak, I. Hutsuliak, M. Solodkyi, and O. Maslynchuk "The influence of the transition layer of CdTe:Cl/MoO_x heterostructures on the electrical and spectroscopic properties of detector systems", Proc. SPIE 12938, Sixteenth International Conference on Correlation Optics, 129382H (5 January 2024); https://doi.org/10.1117/12.3015878

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