Presentation + Paper
18 June 2024 Quantitative assessment of thin tumor depth and thickness in multi-layered silicone phantoms using low-resolution Raman spectroscopy
Subitcha Jayasankar, Sujatha Narayanan Unni
Author Affiliations +
Abstract
Perceiving the depth of flat and thin adenomas and the extent of invasion is vital in staging, diagnosis, treatment planning, and surgical precision. Raman spectroscopy and its spatially offset version have demonstrated excellent specificity in tissue classification and tumor margin analysis using label-free methods. In this work, we utilize fiber-optic Raman spectroscopy to simultaneously predict the depth and thickness of thin sub-surface tumors using tissue-like multi-layer phantoms. Silicone phantoms incorporating Hydroxyapatite distribution are used as a Raman scatterer to indicate malignant calcifications. The signal intensity for varied tumor depths and thicknesses is also numerically simulated and corroborated with experiments. The high-wavenumber Raman spectrum is captured using a fiber-optic low-resolution spectrometer with an excitation wavelength of 660 nm. The tumor's depth and thickness range from 0.5 mm to 2 mm in 0.5 mm increments. Partial Least Squares Regression (PLSR) analysis is carried out on the acquired dataset for predicting the tumor depth and thickness with a Root Mean Square Error (RMSE) of 0.268 mm (36.33%) and 0.120 mm (12.89%), respectively.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Subitcha Jayasankar and Sujatha Narayanan Unni "Quantitative assessment of thin tumor depth and thickness in multi-layered silicone phantoms using low-resolution Raman spectroscopy", Proc. SPIE 13010, Tissue Optics and Photonics III, 1301007 (18 June 2024); https://doi.org/10.1117/12.3016759
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Tumors

Raman spectroscopy

Raman scattering

Simulations

Tissues

Silicon

Optical properties

Back to Top