Inspection of short surface cracks by inductive thermography and by computer tomography

B. Oswald-Tranta; A. Hackl; E. Gorostegui-Colinas; A. Muniategui Merino; Ph. Westphal

doi:10.1117/12.3013073

7 June 2024 Inspection of short surface cracks by inductive thermography and by computer tomography

B. Oswald-Tranta, A. Hackl, E. Gorostegui-Colinas, A. Muniategui Merino, Ph. Westphal

Proceedings Volume 13047, Thermosense: Thermal Infrared Applications XLVI; 130470P (2024) https://doi.org/10.1117/12.3013073
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Abstract

Inductive thermography is a non-destructive inspection technique. The sample is heated with a short heating pulse and an IR camera records the surface temperature, which is then evaluated to a phase image by Fourier transform. The technique can be well applied for detecting cracks in metals. Additionally, it has also the advantage of providing information about the depth of the crack. Larger contrast is an indication of deeper cracks, while small contrasts refer to shallow cracks. Therefore, the phase contrast can be used to make an estimation of the considered crack. In order to investigate these capabilities, short cracks (length =0.3-3mm) were created in Inconel 718 welded samples by a Varestraint test machine. The samples were then inspected with inductive thermography, computer tomography (CT) and by fluorescent penetrant test (FPT). The crack lengths obtained by all the three methods are compared. The dependency of the phase contrast on the crack depth and length is then analyzed in comparison to the CT results. Finally, additional finite element simulations were carried out and compared to the experimental results.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

B. Oswald-Tranta, A. Hackl, E. Gorostegui-Colinas, A. Muniategui Merino, and Ph. Westphal "Inspection of short surface cracks by inductive thermography and by computer tomography", Proc. SPIE 13047, Thermosense: Thermal Infrared Applications XLVI, 130470P (7 June 2024); https://doi.org/10.1117/12.3013073

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available