CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 13071 > Article
Paper
28 February 2024 An improved PCB defect detection algorithm for YOLOv7-tiny
Yang Yang, Qin Qiang
Author Affiliations +
Proceedings Volume 13071, International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023); 130712P (2024) https://doi.org/10.1117/12.3025456
Event: International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023), 2023, Shenyang, China
Abstract
In the manufacturing of printed circuit boards, due to production processes and other issues that can easily lead to defects in the circuit board. In order to improve the efficiency of circuit board defect detection, a defect detection algorithm for bare PCB based on improved YOLOv7-tiny is proposed. First, a new ELAN structure, New-ELAN, is proposed to replace the ELAN structure in the Head section, and the three detection heads in the Head section are reduced to two. Next, reconnecting the Neck structure and reducing the number of channels to reduce computation. The experimental results show that: under certain training conditions, the improved YOLOv7-tiny's mAP value reaches 93.9%, which is 4.8% higher than the original model. In addition, the speed and size of the improved model remain essentially the same. The improved model has better detection results.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Yang Yang and Qin Qiang "An improved PCB defect detection algorithm for YOLOv7-tiny", Proc. SPIE 13071, International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023), 130712P (28 February 2024); https://doi.org/10.1117/12.3025456
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Detection and tracking algorithms
Defect detection
Deep learning
Target detection
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top