Presentation + Paper
30 September 2024 Aspherical surface measurement: a cost-effective and fast AI solution
Author Affiliations +
Abstract
Optical aspherical surfaces have become more widely used as they offer advantages such as improved image quality, compact design, increased light gathering, and reduced distortion. However, measuring aspherical surfaces presents challenges due to their non-spherical shapes. The primary difficulties include the complexity of surface geometries and the need for specialized metrology equipment. These challenges require advanced measurement techniques to ensure accurate characterization and quality control of aspherical surfaces in various applications. This paper introduces an innovative, AI-driven solution for the measurement of aspherical surfaces within the image space, offering a flexible optical metrology tool for measuring aspherical surfaces. This approach is characterized by its ability to deliver rapid and cost-effective integration without the need for custom, complex optics.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Gaston Baudat and Robert E. Parks "Aspherical surface measurement: a cost-effective and fast AI solution", Proc. SPIE 13134, Optical Manufacturing and Testing 2024, 1313403 (30 September 2024); https://doi.org/10.1117/12.3027354
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KEYWORDS
Wavefronts

Wavefront errors

Point spread functions

Education and training

Monochromatic aberrations

Microscopes

Spherical lenses

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