Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring

Eric A. Wachter; John W. Haas III; David R. James; Richard B. Gammage; Trinidad L. Ferrell; Tuan Vo-Dinh

doi:10.1117/12.22916

1 November 1990 Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring

Eric A. Wachter, John W. Haas III, David R. James, Richard B. Gammage, Trinidad L. Ferrell, Tuan Vo-Dinh

Proceedings Volume 1336, Raman and Luminescence Spectroscopies in Technology II; (1990) https://doi.org/10.1117/12.22916
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Surface-enhanced Raman spectroscopy is being evaluated for use as an advanced method for detecting organic contaminants in groundwater during field-screening of environmental samples. The SERS technique offers attractive and unique capabilities for detecting a wide range of organic contaminants in aqueous environments at ppm to ppb levels. An inexpensive computer-controlled portable spectrometer system coupled to a fiberoptic probe has been developed for rapid on-site and in situ determination of organic contamination in groundwater. Applications of recent advances in substrate fabrication for use with environmental samples are discussed, and critical issues pertaining to substrate durability, repeatability, sensitivity, selectivity and universality are addressed.

Citation Download Citation

Eric A. Wachter, John W. Haas III, David R. James, Richard B. Gammage, Trinidad L. Ferrell, and Tuan Vo-Dinh "Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring", Proc. SPIE 1336, Raman and Luminescence Spectroscopies in Technology II, (1 November 1990); https://doi.org/10.1117/12.22916

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