Photoelectric effect from CsI by polarized soft x-rays

Ping-Shine Shaw; Eric D. Church; Shaul Hanany; Yee Liu; Judith R. Fleischman; Philip E. Kaaret; Robert Novick; Giuseppe Manzo

doi:10.1117/12.23218

1 February 1991 Photoelectric effect from CsI by polarized soft x-rays

Ping-Shine Shaw, Eric D. Church, Shaul Hanany, Yee Liu, Judith R. Fleischman, Philip E. Kaaret, Robert Novick, Giuseppe Manzo

Author Affiliations +

Proceedings Volume 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography; (1991) https://doi.org/10.1117/12.23218
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Further studies are reported on the polarization dependence of the photoelectric effect produced by soft X-rays from CsI. A major difficulty in these experiments is the geometrical effects which mimic the polarization signature. We present a detailed calculation of these geometrical effects that are produced when the X-ray beam is not precisely aligned on a rotatable plane photocathode. These effects were observed experimentally and were used in turn to precisely determine the alignment of the incident beam of polarized X-rays on a rotatable photocathode. From these studies, we are able to uniquely determine the true polarization dependence of the photoemission from CsI. We confirm that the photoelectric effect in CsI is dependent on the polarization state of the X-rays. The "phase shift" which was reported previously has now been explained as a result of these off-axis effects. This shows that there is no intrinsic "phase shift" in the polarization dependence of the photoemission from CsI. Preliminary surface analysis of the CsI photocathode was pe'formed to determine the surface quality.

Citation Download Citation

Ping-Shine Shaw, Eric D. Church, Shaul Hanany, Yee Liu, Judith R. Fleischman, Philip E. Kaaret, Robert Novick, and Giuseppe Manzo "Photoelectric effect from CsI by polarized soft x-rays", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23218

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