Electrical characteristics of lossy interconnections for high-performance computer applications

Alina Deutsch; Gerard V. Kopcsay; V. A. Ranieri; J. K. Cataldo; E. A. Galligan; W. S. Graham; R. P. McGouey; S. L. Nunes; Jurij R. Paraszczak; J. J. Ritsko; R. J. Serino; D. Y. Shih; Janusz S. Wilczynski

doi:10.1117/12.25520

1 April 1991 Electrical characteristics of lossy interconnections for high-performance computer applications

Alina Deutsch, Gerard V. Kopcsay, V. A. Ranieri, J. K. Cataldo, E. A. Galligan, W. S. Graham, R. P. McGouey, S. L. Nunes, Jurij R. Paraszczak, J. J. Ritsko, R. J. Serino, D. Y. Shih, Janusz S. Wilczynski

Author Affiliations +

Proceedings Volume 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies; (1991) https://doi.org/10.1117/12.25520
Event: Advances in Intelligent Robotics Systems, 1990, Boston, MA, United States

Abstract

This paper discusses the maximum usable length (''max) for high-speed pulse propagation and its dependence on signal line resistance (R) for a range of wiring technologies. As an example we present results from measurements and analyses of experimental interconnection structures and their agreement is highlighted. The analysis is based on a transmission line model which includes frequency-dependent losses such as skin-effect and dielectric dispersion. The paper addresses the problems found on lossy lines such as reflections rise-time slow down increased delay attenuation and crosstalk. A wide bandwidth test system that relies on novel high frequency and high impedance coaxial probes which was developed to characterize our test structures is described. The limiting factors that affect circuitto- circuit path delays in high-performance computers are then discussed and guidelines are given for maintaining distortion-free propagation of high-speed signals. Simulations of resistive interconnections in a practical digital environment are presented.

Citation Download Citation

Alina Deutsch, Gerard V. Kopcsay, V. A. Ranieri, J. K. Cataldo, E. A. Galligan, W. S. Graham, R. P. McGouey, S. L. Nunes, Jurij R. Paraszczak, J. J. Ritsko, R. J. Serino, D. Y. Shih, and Janusz S. Wilczynski "Electrical characteristics of lossy interconnections for high-performance computer applications", Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); https://doi.org/10.1117/12.25520

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