Switching noise in a medium-film copper/polyimide multichip module

Peter A. Sandborn; Seyed Hassan Hashemi; William Weigler

doi:10.1117/12.25521

1 April 1991 Switching noise in a medium-film copper/polyimide multichip module

Peter A. Sandborn, Seyed Hassan Hashemi, William Weigler

Proceedings Volume 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies; (1991) https://doi.org/10.1117/12.25521
Event: Advances in Intelligent Robotics Systems, 1990, Boston, MA, United States

Abstract

This paper describes the analysis of switching noise in a 9-layer medium film copper/polyimide module. Equivalent circuit models which are used to understand and extend experimental results were constructed using a CAD tool which has been previously described. Results for this vehicle are used to study the dependence of noise magnitude on various module parameters including the number of switching gates the edge rate and the value and placement of bypass capacitance as well as assess the validity of various analytical switching noise models which have appeared in the literature.

Citation Download Citation

Peter A. Sandborn, Seyed Hassan Hashemi, and William Weigler "Switching noise in a medium-film copper/polyimide multichip module", Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); https://doi.org/10.1117/12.25521

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