Characterization of a high-critical-temperature superconducting thin film by the ring resonator method

Maurice Pyee; Pascal Meisse; Henry Baudrand; Michel Chaubet

doi:10.1117/12.47169

1 September 1991 Characterization of a high-critical-temperature superconducting thin film by the ring resonator method

Maurice Pyee, Pascal Meisse, Henry Baudrand, Michel Chaubet

Proceedings Volume 1512, Infrared and Optoelectronic Materials and Devices; (1991) https://doi.org/10.1117/12.47169
Event: ECO4 (The Hague '91), 1991, The Hague, Netherlands

Abstract

The realization of an experimental setup for the characterization of a high critical temperature superconductor (HTCS) thin film by a microwave measurement is described. This approach allows HTCS parameters, like surface resistance in microwaves, to be determined from experimental measurements.

Citation Download Citation

Maurice Pyee, Pascal Meisse, Henry Baudrand, and Michel Chaubet "Characterization of a high-critical-temperature superconducting thin film by the ring resonator method", Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); https://doi.org/10.1117/12.47169

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