New imaging mode in atomic-force microscopy based on the error signal

Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niko F. van Hulst; Jan Greve; Paul K. Hansma

doi:10.1117/12.58191

1 May 1992 New imaging mode in atomic-force microscopy based on the error signal

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niko F. van Hulst, Jan Greve, Paul K. Hansma

Proceedings Volume 1639, Scanning Probe Microscopies; (1992) https://doi.org/10.1117/12.58191
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

Citation Download Citation

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niko F. van Hulst, Jan Greve, and Paul K. Hansma "New imaging mode in atomic-force microscopy based on the error signal", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); https://doi.org/10.1117/12.58191

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