Substrate guided-wave holo-interferometry

Qiang Huang; John A. Gilbert; H. John Caulfield

doi:10.1117/12.59631

1 May 1992 Substrate guided-wave holo-interferometry

Qiang Huang, John A. Gilbert, H. John Caulfield

Proceedings Volume 1667, Practical Holography VI; (1992) https://doi.org/10.1117/12.59631
Event: SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology, 1992, San Jose, CA, United States

Abstract

This paper describes a new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry. The approach relies on recording and reconstructing time- average, double-exposure, and real-time holograms using light waves guided to the hologram by a dielectric sheet, or substrate waveguide. The study illustrates that SGW holo- interferometry can be used to isolate the reference wavefront from the environment surrounding the hologram, and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.

Citation Download Citation

Qiang Huang, John A. Gilbert, and H. John Caulfield "Substrate guided-wave holo-interferometry", Proc. SPIE 1667, Practical Holography VI, (1 May 1992); https://doi.org/10.1117/12.59631

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