New technique for measuring the ionizing radiation effects in metal oxide semiconductor transistors

Naresh C. Das; Vaidya Nathan

doi:10.1117/12.60541

1 July 1992 New technique for measuring the ionizing radiation effects in metal oxide semiconductor transistors

Naresh C. Das, Vaidya Nathan

Proceedings Volume 1686, Test and Evaluation of IR Detectors and Arrays II; (1992) https://doi.org/10.1117/12.60541
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

A simple technique based on the measurement of gate induced drain leakage current (Idl) is developed to measure the radiation induced charge in the metal oxide semiconductor transistor. After irradiation Idl of n-channel MOS transistors decreases while that of p-channel devices increases. The change of leakage current at higher tunneling fields is proportional to the increase of hole trap density in the gate oxide region. The leakage current measurement technique is an useful tool for characterizing radiation effects in MOS transistors because at high biases Idl is dependent on the increase of oxide charge while independent of the interface states. It depends on gate and drain overlap geometry and independent of the channel length. Hence Idl measurement technique is advantageous over threshold voltage technique which depends on the channel length.

Citation Download Citation

Naresh C. Das and Vaidya Nathan "New technique for measuring the ionizing radiation effects in metal oxide semiconductor transistors", Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); https://doi.org/10.1117/12.60541

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available