Paper
20 October 1992 Analysis of zone-plate interference fringe pattern
Kazuhide Kamiya, Takashi Nomura, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, Masane Suzuki
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132138
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
The zone-plate interference fringe pattern is analyzed by FFT. The spectrum obtained by FFT contains information on the shape error. To select the information on the shape error from the spectrum of the fringe pattern is difficult, because the resolution of the spectrum is low. An FFT with over-sampling is applied to increase the spectrum resolution. A method is proposed to select the necessary information from the spectrum of the fringe pattern. Experimental results obtained by the proposed method agree well with those obtained by Fizeau interferometer.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazuhide Kamiya, Takashi Nomura, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, and Masane Suzuki "Analysis of zone-plate interference fringe pattern", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132138
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KEYWORDS
Fringe analysis

Interferometers

Fizeau interferometers

Optics manufacturing

Cutting equipment

Manufacturing

Error analysis

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