Paper
20 October 1992 Fabrication and evaluation of Cr-C multilayer mirrors for soft x rays
Masahito Niibe, Masami Tsukamoto, Takashi Iizuka, Akira Miyake, Yutaka Watanabe, Yasuaki Fukuda
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132127
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
We have selected Cr and C as a material pair of multilayer (ML) mirrors for soft x rays at the wavelength near 5 nm. The Cr-C ML structures have successfully been fabricated with rf- magnetron sputtering. The ML structures have been characterized with transmission electron microscopy (TEM), x-ray diffraction, and reflectivity measurement by SR light. From the observation of TEM images, Cr-C MLs had uniform and less-defective layered structures with the d-spacing down to 2.4 nm. Reflectivities at normal and grazing incidence were remarkably decreased with decreasing the ML d-spacing. Normal incidence reflectivity at 5 nm was as high as 7%. The regularity of the d-spacing of the MLs was evaluated with a moire image that was formed by putting a reference stripe pattern on the cross-sectional TEM micrograph. Compared to Ni-C MLs, Cr-C is a preferable material combination for x-ray mirrors for shorter wavelength and normal incidence.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masahito Niibe, Masami Tsukamoto, Takashi Iizuka, Akira Miyake, Yutaka Watanabe, and Yasuaki Fukuda "Fabrication and evaluation of Cr-C multilayer mirrors for soft x rays", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132127
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Cited by 6 scholarly publications.
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KEYWORDS
Reflectivity

Transmission electron microscopy

X-rays

Chromium

Mirrors

Moire patterns

Crystals

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