Long-range effects of gain depression in microchannel plates

Michael L. Edgar; Alan Smith; Jonathan S. Lapington

doi:10.1117/12.130690

8 October 1992 Long-range effects of gain depression in microchannel plates

Michael L. Edgar, Alan Smith, Jonathan S. Lapington

Proceedings Volume 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III; (1992) https://doi.org/10.1117/12.130690
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

It has been found that the gain depression in MCP's operated at high gains is a relatively long range phenomenon. Active pores can significantly depress the gain in the surrounding quiescent pores at distances of the order of millimeters. This is of fundamental importance for detectors in which high point source count rates are encountered. We have measured this effect for a variety of plate operating conditions and point source count rates and find that in all cases there is a constant limiting radius. We have also determined that the gain depression has a long term effect on the MCP.

Citation Download Citation

Michael L. Edgar, Alan Smith, and Jonathan S. Lapington "Long-range effects of gain depression in microchannel plates", Proc. SPIE 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III, (8 October 1992); https://doi.org/10.1117/12.130690

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