Photothermal measurement of temperature-dependent absorbance of infrared components

Peter Eckardt; Heinz-Guenter Walther; W. Richter

doi:10.1117/12.140970

1 January 1993 Photothermal measurement of temperature-dependent absorbance of infrared components

Peter Eckardt, Heinz-Guenter Walther, W. Richter

Proceedings Volume 1781, Specification and Measurement of Optical Systems; (1993) https://doi.org/10.1117/12.140970
Event: Optical Systems Design '92, 1992, Berlin, Germany

Abstract

The absorbance of an Au/ZnS/Ge thin film system, Au/ZnS, Au/BaF₂, Au/PbF₂ film combinations, and of bulk Ge were measured as a function of increasing temperature in the infrared spectral range with a photothermal beam deflection (PBD) arrangement.

Citation Download Citation

Peter Eckardt, Heinz-Guenter Walther, and W. Richter "Photothermal measurement of temperature-dependent absorbance of infrared components", Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); https://doi.org/10.1117/12.140970

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