Radiation response of 1300-nm optoelectronic components in a natural space environment

Cheryl J. Dale; Paul W. Marshall

doi:10.1117/12.141165

25 February 1993 Radiation response of 1300-nm optoelectronic components in a natural space environment

Cheryl J. Dale, Paul W. Marshall

Proceedings Volume 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments; (1993) https://doi.org/10.1117/12.141165
Event: Fibers '92, 1992, Boston, MA, United States

Abstract

We report energy-dependent proton and Co-60 test results and analysis assessing performance of In_0.53Ga_0.47As photodetectors and In_0.71Ga_0.29As_0.61P_0.39 laser diodes for satellite applications. Calculations of the nonionizing energy loss (NIEL) for protons in InGaAs allow damage assessment using a general technique for evaluating displacement damage in orbit. Device performance is predicted for several shield thicknesses and orbital conditions. We also discuss effects in optoelectronic devices due to total dose and ionization transients.

Citation Download Citation

Cheryl J. Dale and Paul W. Marshall "Radiation response of 1300-nm optoelectronic components in a natural space environment", Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); https://doi.org/10.1117/12.141165

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available