Paper
24 June 1993 Buried heterostructure lasers based on InGaAsP/InP
Ralph A. Logan, B. Lee, R. F. Karlicek, Sung-Nee G. Chu
Author Affiliations +
Proceedings Volume 1851, Processing and Packaging of Semiconductor Lasers and Optoelectronic Devices; (1993) https://doi.org/10.1117/12.147587
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
Abstract
Buried heterostructure lasers are formed by the regrowth of InP current blocking junctions around mesas etched in planar structures. Using metal organic vapor phase epitaxy (MOVPE) at atmospheric pressure, growth patterns were observed by inserting lattice matched 1.5 nm InGaAs or doping striations in the regrown layers. The conditions for planar regrowth are described using wet-etched mesas. With mesas formed by reactive ion etching, planar regrowth is easily achievable when Cl is added to the gas ambient using the pyrolysis of trichloroethane (TCA). When RIE mesas are cleaned and slightly etched (< 0.1 micrometers ), the laser properties are indistinguishable from those formed by wet etching, a result that has important implications for the processing of large area wafers (2 inch diameter) uniformly into lasers with controlled dimensional properties.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ralph A. Logan, B. Lee, R. F. Karlicek, and Sung-Nee G. Chu "Buried heterostructure lasers based on InGaAsP/InP", Proc. SPIE 1851, Processing and Packaging of Semiconductor Lasers and Optoelectronic Devices, (24 June 1993); https://doi.org/10.1117/12.147587
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KEYWORDS
Photomasks

Reactive ion etching

Heterojunctions

Etching

Chlorine

Semiconducting wafers

Doping

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