Experiments in sideband suppression on the Los Alamos National Laboratory free-electron laser

Cheryl J. White; M. R. Coyle; Alan H. Paxton; Patrick G. O'Shea; Steven C. Bender; Donald A. Byrd; Donald W. Feldman; John C. Goldstein; Eric J. Pitcher; Thomas J. Zaugg

doi:10.1117/12.150635

13 August 1993 Experiments in sideband suppression on the Los Alamos National Laboratory free-electron laser

Cheryl J. White, M. R. Coyle, Alan H. Paxton, Patrick G. O'Shea, Steven C. Bender, Donald A. Byrd, Donald W. Feldman, John C. Goldstein, Eric J. Pitcher, Thomas J. Zaugg

Author Affiliations +

Proceedings Volume 1868, Laser Resonators and Coherent Optics: Modeling, Technology, and Applications; (1993) https://doi.org/10.1117/12.150635
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

Two versions of the 'Phase-Step Mirror' (PSM), a novel optical component that prevents the formation of sidebands in a Free-Electron Laser (FEL) were tested on the Los Alamos National Laboratory (LANL) APEX FEL. Sideband suppression and frequency control with high extraction efficiency and single line, transform limited operation were demonstrated. The results of our LANL experiments and computer simulations showed that for very high gain applications, the first-order sideband is completely suppressed, but the laser gain is so strong that on about pass 300 the sideband at the second-order or next free spectral range of the PSM appears. This second-order sideband may be suppressed by designing a PSM with grooves having two alternating depths, one chosen to suppress the first-order sideband, and the other, the second-order sideband.

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Cheryl J. White, M. R. Coyle, Alan H. Paxton, Patrick G. O'Shea, Steven C. Bender, Donald A. Byrd, Donald W. Feldman, John C. Goldstein, Eric J. Pitcher, and Thomas J. Zaugg "Experiments in sideband suppression on the Los Alamos National Laboratory free-electron laser", Proc. SPIE 1868, Laser Resonators and Coherent Optics: Modeling, Technology, and Applications, (13 August 1993); https://doi.org/10.1117/12.150635

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