Stability of IAD refractory oxide narrowband interference filters

John R. Potter; John C. Simons

doi:10.1117/12.161397

15 November 1993 Stability of IAD refractory oxide narrowband interference filters

John R. Potter, John C. Simons

Proceedings Volume 1952, Surveillance Technologies and Imaging Components; (1993) https://doi.org/10.1117/12.161397
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

The physical and spectral characteristics of refractory oxide narrowband optical filters, fabricated with an ion-assisted deposition process are investigated. The properties of tantalum pentoxide (Ta₂O₅) and silicon dioxide (SiO₂) are compared with more conventional zinc sulfide (ZnS) and cryolite (Na₃AlF₆) optical interference filters, for effects of radiation, moisture and abrasion, as well as thermal stability. Filter longevity and thermal properties are dramatically improved, which can have a significant impact on the performance of space-borne optical systems.

Citation Download Citation

John R. Potter and John C. Simons "Stability of IAD refractory oxide narrowband interference filters", Proc. SPIE 1952, Surveillance Technologies and Imaging Components, (15 November 1993); https://doi.org/10.1117/12.161397

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available