Unified mirror surface profile using subaperture testing

George W. Jones

doi:10.1117/12.167977

1 February 1994 Unified mirror surface profile using subaperture testing

George W. Jones

Proceedings Volume 1994, Advanced Optical Manufacturing and Testing IV; (1994) https://doi.org/10.1117/12.167977
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The best surface testing of large optical components frequently requires large auxiliary test optics which are expensive. One example is the testing of a large primary mirror in autocollimation. A method has been developed which allows the testing of large optics using subaperture interferometric testing. Sufficient subaperture profiles are obtained to cover the entire surface. Then these subaperture profiles are combined into a unified profile of the mirror's surface.

Citation Download Citation

George W. Jones "Unified mirror surface profile using subaperture testing", Proc. SPIE 1994, Advanced Optical Manufacturing and Testing IV, (1 February 1994); https://doi.org/10.1117/12.167977

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