30.4-nm narrowband multilayer reflection filters

Muamer Zukic; Jongmin Kim; Douglas G. Torr

doi:10.1117/12.147640

7 July 1993 30.4-nm narrowband multilayer reflection filters

Muamer Zukic, Jongmin Kim, Douglas G. Torr

Proceedings Volume 2008, Instrumentation for Magnetospheric Imagery II; (1993) https://doi.org/10.1117/12.147640
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

We report designs of multilayer narrowband reflective 30.4 nm filters. The narrowband reflection filters are designed for angles of incidence (theta) _o, ranging from 0 degree(s) - 30 degree(s). For example, the calculated reflectance of a 15-layer Au-Al multilayer which operates within the angular range 0 degree(s) <EQ (theta) _o <EQ 10 degree(s) has for 0 degree(s) angle of incidence a reflectance peak value of 24% at 30.4 nm with a bandwidth of less than 5 nm. The average out-of-band reflectance is less than 2% for the wavelength range from 10 nm - 70 nm. Filters with more than 20% peak reflectance and less than 5 nm bandwidths are designed for incident angular cones from 0 degree(s) - 10 degree(s), 10 degree(s) - 20 degree(s).

Citation Download Citation

Muamer Zukic, Jongmin Kim, and Douglas G. Torr "30.4-nm narrowband multilayer reflection filters", Proc. SPIE 2008, Instrumentation for Magnetospheric Imagery II, (7 July 1993); https://doi.org/10.1117/12.147640

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