Paper
15 February 1994 Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer
Hiroaki Kimura, Toyohiko Kinoshita, Shyouzi Suzuki, Tsuneaki Miyahara, Masaki Yamamoto
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Abstract
We have measured the states of polarization of synchrotron radiation at a few beamlines at the Photon Factory using multilayer mirrors as a polarizer or an analyzer. Remarkable differences between the observed data and the theoretical prediction have been found for bending magnet radiation. It has been also found that changes of the states of polarization, especially the inclination of the major axis of the polarization ellipses is caused by the beamline optics both for bending and undulator radiation.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroaki Kimura, Toyohiko Kinoshita, Shyouzi Suzuki, Tsuneaki Miyahara, and Masaki Yamamoto "Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168588
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CITATIONS
Cited by 8 scholarly publications.
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KEYWORDS
Polarization

Polarizers

X-rays

Ellipsometry

Synchrotron radiation

Polarimetry

Ultraviolet radiation

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