Optical and structural studies of Cu-SiO cermet thin films

Mohammad Sayeedur R Khan; E. J. Beynon

doi:10.1117/12.161972

22 October 1993 Optical and structural studies of Cu-SiO cermet thin films

Mohammad Sayeedur R Khan, E. J. Beynon

Proceedings Volume 2017, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII; (1993) https://doi.org/10.1117/12.161972
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Optical absorption measurements have been carried out on Cu-SiO cermet films of the thickness range 200 - 400 nm, prepared by thermal co-evaporation in vacuo approximately 1mPa. The optical band gap E_opt varied between 2.58 and 2.05 eV over the composition range 5 - 15 vol% Cu of the cermet. The addition of Cu to the cermet causes a systematic reduction of E_opt. The values of E_e were found to increase as the copper concentration increased. Electron micrographs indicated a two-phase structure consisting of discrete metallic particles, 1.5 - 3.0 nm in size, in a continuous amorphous phase. The mean particle size increased with increasing Cu content and substrate temperature.

Citation Download Citation

Mohammad Sayeedur R Khan and E. J. Beynon "Optical and structural studies of Cu-SiO cermet thin films", Proc. SPIE 2017, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII, (22 October 1993); https://doi.org/10.1117/12.161972

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