640 x 480 MWIR HgCdTe FPA

Lester J. Kozlowski; Robert B. Bailey; Kadri Vural

doi:10.1117/12.160562

1 November 1993 640 x 480 Mwir HgCdTe FPA

Lester J. Kozlowski, Robert B. Bailey, Kadri Vural

Proceedings Volume 2020, Infrared Technology XIX; (1993) https://doi.org/10.1117/12.160562
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

A high performance 640 X 480 focal plane array has been developed for the 1 - 5 micron band with excellent sensitivity at temperatures below 120 K. The detectors are processed on 2' or 3' diameter PACE-I (producible alternative to CdTe for epitaxy) HgCdTe material. The multiplexer is a direct injection input, switched-FET device with four independent quadrants. The detector is hybridized to the multiplexer through indium columns and is characterized. A mean camera NE(Delta) T (noise equivalent temperature difference) of 13 mK has been achieved for temperatures <EQ 120 K. Background-limited (BLIP) D* of 1 X 10¹² Jones (cm-(root)Hz/W) has been measured for 10¹⁴ phs/cm²-s background at 95 K. The hybrids have been thermally cycled for 15 times with no interconnect loss. Interconnect yields as high as 99.3% have been achieved.

Citation Download Citation

Lester J. Kozlowski, Robert B. Bailey, and Kadri Vural "640 x 480 Mwir HgCdTe FPA", Proc. SPIE 2020, Infrared Technology XIX, (1 November 1993); https://doi.org/10.1117/12.160562

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