Coarser-to-finer inspection using 3D data

M. Arif Wani; Bruce G. Batchelor

doi:10.1117/12.150289

6 August 1993 Coarser-to-finer inspection using 3D data

M. Arif Wani, Bruce G. Batchelor

Proceedings Volume 2064, Machine Vision Applications, Architectures, and Systems Integration II; (1993) https://doi.org/10.1117/12.150289
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

The paper presents a new approach to inspect the objects containing structure at different scales. The approach obtains correct descriptions of objects at a specified scale by processing it only at that scale. This feature of the technique is used to segment and inspect the coarser shape first, the results of which are then used to decide whether or not to segment and inspect the finer parts. This reduces the computational effort, and it also eliminates the need for a sophisticated segmentation technique, which may otherwise be necessary for such objects. The results on real 3-D data of a telephone instrument and a loaf of bread are presented.

Citation Download Citation

M. Arif Wani and Bruce G. Batchelor "Coarser-to-finer inspection using 3D data", Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); https://doi.org/10.1117/12.150289

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