Paper
22 October 1993 New method of large-scale absolute distance measurement
Yongjun Wu, Yang Zhao, Dacheng Li
Author Affiliations +
Proceedings Volume 2066, Industrial Optical Sensing and Metrology: Applications and Integration; (1993) https://doi.org/10.1117/12.162106
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
A frequency-modulation absolute distance measurement techniques using a external-cavity semiconductor laser is proposed. A reference interferometer was adopted in order to reduce the effect of the central frequency drift of the laser on the measurement accuracy. The principle of the measurement is described and the experimental setup is introduced. The measurable range is as large as ten meters.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongjun Wu, Yang Zhao, and Dacheng Li "New method of large-scale absolute distance measurement", Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); https://doi.org/10.1117/12.162106
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Distance measurement

Semiconductor lasers

Mirrors

Interferometers

Modulation

Ferroelectric materials

Metrology

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