New reference line for estimating roughness of an arbitrary curved surface

Shaojun Xiao; Xiangqian Jiang; Tie-Bang Xie

doi:10.1117/12.156319

22 September 1993 New reference line for estimating roughness of an arbitrary curved surface

Shaojun Xiao, Xiangqian Jiang, Tie-Bang Xie

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156319
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

In this paper the authors deal emphatically with the problem of deciding the estimating reference of the roughness of an arbitrary curved surface and put forth a method of fitting its estimating reference with the polynomial ya+bx+cx (l By an analysis of a circular spheroid sample it has been proved that calculation using this model is both highly accurate and very convenient.

Citation Download Citation

Shaojun Xiao, Xiangqian Jiang, and Tie-Bang Xie "New reference line for estimating roughness of an arbitrary curved surface", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156319

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