Paper
30 August 1993 Frequency measurement of sub-millimetre wavelength laser lines using Josephson junctions
M. C. Wicks
Author Affiliations +
Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 21043V (1993) https://doi.org/10.1117/12.2298571
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
Thin film Josephson junctions have been used as harmonic mixers to measure the frequency ofsubmillimetre wavelength laser lines. The highest frequency measured so far is 3.1THz. The need tomeasure frequencies in this spectral region arises from the measurement standards requirement to relateoptical and near optical frequency standards, used for frequency and length measurement, tomicrowave primary frequency standards. Information on submillimetre wave frequencies is alsoimportant to spectroscopists and other workers in what is likely to be an increasingly exploited partof the electromagnetic spectrum.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. C. Wicks "Frequency measurement of sub-millimetre wavelength laser lines using Josephson junctions", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21043V (30 August 1993); https://doi.org/10.1117/12.2298571
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Niobium

Microwave radiation

Thin films

Oscillators

Signal to noise ratio

Thin film devices

Electromagnetism

Back to Top