Paper
28 July 1994 Integrated polarization insensitive 1.3/1.55 micrometer duplexer on silica-based technology
Jean Magerand, Gilles Grand, Patrick Pouteau, P. Phillippe
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Abstract
This paper deals with the realization of a 1.3/1.55 micrometers duplexer integrated on a silica on silicon substrate. The design consists of two cascaded directional couplers in order to enhance the rejection bandwidth. Fabrication is based on plasma enhanced chemical vapor deposition and reactive ionic etching of silica films. The channel guide structure has been optimized to comply with the small distance between guides along the coupler, that would still ensure low loss fiber coupling. The results show an excellent spectral response: insertion loss lower than 3 dB on a 150 nm bandwidth at both wavelengths, crosstalk as low as 20 dB on a 100 nm bandwidth. Moreover, quite a total independence on polarization and temperature has been checked, for the required 1.3/1.55 micrometers separation.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Magerand, Gilles Grand, Patrick Pouteau, and P. Phillippe "Integrated polarization insensitive 1.3/1.55 micrometer duplexer on silica-based technology", Proc. SPIE 2213, Nanofabrication Technologies and Device Integration, (28 July 1994); https://doi.org/10.1117/12.180968
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Polarization

Silica

Waveguides

Directional couplers

Etching

Fiber couplers

Plasma enhanced chemical vapor deposition

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