Understanding infrared clutter through fixation point analysis

Stanley R. Rotman; Marta L. Kowalczyk; Joan F. Cartier; J. Chang

doi:10.1117/12.180084

8 July 1994 Understanding infrared clutter through fixation point analysis

Stanley R. Rotman, Marta L. Kowalczyk, Joan F. Cartier, J. Chang

Proceedings Volume 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V; (1994) https://doi.org/10.1117/12.180084
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

A model is proposed for determining the effect of image clutter on the time-line behavior of observer eye fixations when searching for targets in IR scenery. Several possible metrics for qualitatively evaluating the degree of clutter are tested. Correlations between these metrics, the probability of fixating a particular area and the length of time fixating a particular area will be discussed.

Citation Download Citation

Stanley R. Rotman, Marta L. Kowalczyk, Joan F. Cartier, and J. Chang "Understanding infrared clutter through fixation point analysis", Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); https://doi.org/10.1117/12.180084

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