Paper
13 July 1994 Producibility improvements suggested by a validated process model of seeded CdZnTe vertical Bridgman growth
David J. Larson Jr., Louis G. Casagrande, Don Di Marzio, Alan Levy, Frederick M. Carlson, Taipao Lee, David R. Black, Jun Wu, Michael Dudley
Author Affiliations +
Abstract
We have successfully validated theoretical models of seeded vertical Bridgman-Stockbarger CdZnTe crystal growth and post-solidification processing, using in-situ thermal monitoring and innovative material characterization techniques. The models predict the thermal gradients, interface shape, fluid flow and solute redistribution during solidification, as well as the distributions of accumulated excess stress that causes defect generation and redistribution. Data from the furnace and ampoule wall have validated predictions from the thermal model. Results are compared to predictions of the thermal and thermo-solutal models. We explain the measured initial, change-of-rate, and terminal compositional transients as well as the macrosegregation. Macro and micro-defect distributions have been imaged on CdZnTe wafers from 40 mm diameter boules. Superposition of topographic defect images and predicted excess stress patterns suggests the origin of some frequently encountered defects, particularly on a macro scale, to result from the applied and accumulated stress fields and the anisotropic nature of the CdZnTe crystal. Implications of these findings with respect to producibility are discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Larson Jr., Louis G. Casagrande, Don Di Marzio, Alan Levy, Frederick M. Carlson, Taipao Lee, David R. Black, Jun Wu, and Michael Dudley "Producibility improvements suggested by a validated process model of seeded CdZnTe vertical Bridgman growth", Proc. SPIE 2228, Producibility of II-VI Materials and Devices, (13 July 1994); https://doi.org/10.1117/12.179670
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Cited by 4 scholarly publications.
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KEYWORDS
Process modeling

Thermal modeling

Crystals

Data modeling

Interfaces

Material characterization

Semiconducting wafers

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