Thick volume photorefractive crystal wavelength-multiplexed reflection-type matched filter

Francis T. S. Yu; Shizhuo Yin; Z. H. Yang

doi:10.1117/12.169443

1 March 1994 Thick volume photorefractive crystal wavelength-multiplexed reflection-type matched filter

Francis T. S. Yu, Shizhuo Yin, Z. H. Yang

Proceedings Volume 2237, Optical Pattern Recognition V; (1994) https://doi.org/10.1117/12.169443
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

In this paper, application of thick photorefractive (PR) crystal to wavelength-multiplexed reflection-type matched filter is described. The Bragg diffraction limitation and the shift- invariant property using thick volume PR crystal are discussed, in which we see that the Bragg diffraction is severely limited by the thickness of the crystal. To alleviate the Bragg limitation in terms of shift tolerance, we have shown that the reflection-type wavelength-multiplexed PR filter can be used. Experimental confirmation of these findings are also provided.

Citation Download Citation

Francis T. S. Yu, Shizhuo Yin, and Z. H. Yang "Thick volume photorefractive crystal wavelength-multiplexed reflection-type matched filter", Proc. SPIE 2237, Optical Pattern Recognition V, (1 March 1994); https://doi.org/10.1117/12.169443

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