Paper
1 January 1994 Y-Ba-Cu-O microstrip resonators on sapphire substrates
O. D. Pustylnik
Author Affiliations +
Proceedings Volume 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994; 225050 (1994) https://doi.org/10.1117/12.2303197
Event: Millimeter and Submillimeter Waves and Applications: International Conference, 1994, San Diego, CA, United States
Abstract
We have measured very low microwave losses in Y-Ba-Cu-O fifth wave ring resonators. We deposited the Y-Ba-Cu- O film on (1012) non-buffered sapphire substrates and patterned microwave circuites. High-Tc microstrip resonators demonstrated best Q-factor greater then 800 at 31 GHz, corresponding to surface resistances less than 3,0 mOhm. Indetical copper resonator showed Q's of 500 and surface resistance of 27 mOhm. We show that the losses in the high loss samples can be accounted for by the presence of small fractions of c-axis-aligned grains highly misapplied in the plane of those films. Volume fraction of highly misagned c-axis-oriented grains as 3% lead to losses above 3 mOhm.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. D. Pustylnik "Y-Ba-Cu-O microstrip resonators on sapphire substrates", Proc. SPIE 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994, 225050 (1 January 1994); https://doi.org/10.1117/12.2303197
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KEYWORDS
Resonators

Copper

Sapphire

Microwave radiation

Resistance

Temperature metrology

Helium

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