Paper
4 November 1994 Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers
Pierre J. Roche, Mireille Commandre, Ralf Mollenhauer, Francois Flory
Author Affiliations +
Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192070
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France
Abstract
It has been shown that a good interpretation of the absorption measurements performed from the photothermal deflection (PD) technique is given from a model including interface absorption. This model is applied to analyze the measurements of the losses on guided propagation, and a comparison with results obtained from PD technique is mae for various single-layer films. W show that the same parameters can explain satisfactorily both measurements. This study confirms the existence of absorbing transition layers close to the glass substrate and at the interfaces of the film.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre J. Roche, Mireille Commandre, Ralf Mollenhauer, and Francois Flory "Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192070
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Cited by 3 scholarly publications.
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KEYWORDS
Absorption

Interfaces

Signal attenuation

Scattering

Glasses

Silica

Information operations

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