X-ray optics: imaging of a plasma source with a concave-curved crystal using ray-tracing and wave-optics approaches

Felix N. Chukhovskii; Eckhart Foerster; William Z. Chang; M. Dirksmoeller; Ingo Uschmann

doi:10.1117/12.193145

11 November 1994 X-ray optics: imaging of a plasma source with a concave-curved crystal using ray-tracing and wave-optics approaches

Felix N. Chukhovskii, Eckhart Foerster, William Z. Chang, M. Dirksmoeller, Ingo Uschmann

Author Affiliations +

Proceedings Volume 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics; (1994) https://doi.org/10.1117/12.193145
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Using doubly bent crystal optics, x-ray imaging of a plasma source with doubly bent crystal optics is investigated, employing both the ray-tracing and the wave-optics approaches. The description of the x-ray plasma imaging experiment is given, which includes the considerations of the crystal, the reflection, and the bending radius selections for achieving a spectral resolution up to 10^-4 without compromising the diffracted intensity. The principles of these two approaches are discussed and applied to the experimental case for the x-ray radiation of the Ly(beta) line of hydrogen-like Argon ions. Results of the calculations are compared and for the discrepancies explained. It is found between these two approaches that the principal difference in the results of the calculations can be attributed to the optical Fresnel diffraction effect, which is not taken into account in the ray-tracing method.

Citation Download Citation

Felix N. Chukhovskii, Eckhart Foerster, William Z. Chang, M. Dirksmoeller, and Ingo Uschmann "X-ray optics: imaging of a plasma source with a concave-curved crystal using ray-tracing and wave-optics approaches", Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); https://doi.org/10.1117/12.193145

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