High-resolution Mueller matrix imaging polarimetry for understanding high-resolution optoelectronic modulators

J. Larry Pezzaniti; Russell A. Chipman

doi:10.1117/12.187320

29 September 1994 High-resolution Mueller matrix imaging polarimetry for understanding high-resolution optoelectronic modulators

J. Larry Pezzaniti, Russell A. Chipman

Author Affiliations +

Proceedings Volume 2297, Photonics for Processors, Neural Networks, and Memories II; (1994) https://doi.org/10.1117/12.187320
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

A high resolution Mueller matrix imaging polarimetry test bed has been constructed and calibrated that has unique capabilities for characterizing optoelectronic devices, such as liquid crystal modulators, PLZT modulators, quantum well modulators, and surface emitting lasers. Similarly, the instrument can perform end-to-end measurements on optoelectronic systems including optical computers, interconnects, and correlators. It addresses, at the systems level, the need for incorporating polarimetric analysis and measurement techniques into the design, alignment, and testing of photonics technologies. The polarimeter maps the polarization altering characteristics of optical devices and optical systems, producing means of the retardance, the diattenuation, and the depolarization. The polarization mappings may be obtained across individual pixels or across large pixel arrays. The data sets provide a wealth of information not otherwise accessible for characterizing device uniformity, operating parameters, angular bandwidth, as well as identifying non-ideal polarization characteristics.

Citation Download Citation

J. Larry Pezzaniti and Russell A. Chipman "High-resolution Mueller matrix imaging polarimetry for understanding high-resolution optoelectronic modulators", Proc. SPIE 2297, Photonics for Processors, Neural Networks, and Memories II, (29 September 1994); https://doi.org/10.1117/12.187320

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