Paper
30 December 1994 Comparison between MDA and two edge detectors for SAR image analysis
Carlo S. Regazzoni
Author Affiliations +
Abstract
A comparison is performed among three edge detectors operating on Synthetic Aperture Radar (SAR) images: Canny filter, Ratio detector and Multilevel Deterministic Annealing with a speckle noise model. The first method represents classical edge extractors, based on a regularised estimation of the derivatives of the image function. The Ratio Detector is an example of a Constant False Alarm Rate methods used for edge detection in speckle-noise, which rely on a detection criterion independent from the average gray-level of the decision region. The method defined Multilevel Deterministic Annealing is based on a non-linear statistical criterion which takes into account not only local properties of the image function, but also its global characteristics. The three detectors are evaluated on the basis of false-alarm and detection errors computed on the basis of the apriori known output of a synthetic scene. A qualitative evaluation on real images is also provided. It is shown that Multilevel Deterministic Annealing provides better results despite of a higher computational load.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carlo S. Regazzoni "Comparison between MDA and two edge detectors for SAR image analysis", Proc. SPIE 2315, Image and Signal Processing for Remote Sensing, (30 December 1994); https://doi.org/10.1117/12.196758
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Synthetic aperture radar

Edge detection

Image processing

Annealing

Gaussian filters

Image filtering

RELATED CONTENT

A new robust image feature point detector
Proceedings of SPIE (February 14 2020)
A PolSAR image despeckle filter based on evidence theory
Proceedings of SPIE (October 22 2010)
Sar Image Processing For Classification Purposes
Proceedings of SPIE (March 02 1989)
Image enhancement for phase shift analysis sensors
Proceedings of SPIE (October 13 2006)

Back to Top