Electronic speckle pattern interferometrie through shearography

Bernd Schulz

doi:10.1117/12.185340

8 September 1994 Electronic speckle pattern interferometrie through shearography

Bernd Schulz

Proceedings Volume 2358, First International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (1994) https://doi.org/10.1117/12.185340
Event: Vibration Measurements by Laser Techniques: First International Conference, 1994, Ancona, Italy

Abstract

Measurement systems based on image processing are used more and more in quality control. With aid of the interference ability of laserlight it is possible to gain the lost third dimension of 'normal' images in form of a phase relation. At the Lehrstuhl fur Feingeratebau der TU Munchen an electronic-speckle-pattern-interferometry (ESPI)-camera was constructed and continuously developed. The new arrangement enables to evaluate vibrations and deformations by ESPI and by Shearing Interferometry. Enjoyable are also the small dimensions of the camera.

Citation Download Citation

Bernd Schulz "Electronic speckle pattern interferometrie through shearography", Proc. SPIE 2358, First International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (8 September 1994); https://doi.org/10.1117/12.185340

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