Application of frustrated total reflection

Oliver S. Heavens

doi:10.1117/12.190746

26 October 1994 Application of frustrated total reflection

Oliver S. Heavens

Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190746
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China

Abstract

By the use of total reflection of a laser beam to generate fluorescence in a second medium, surface contours of, e.g., cells may be determined with an accuracy of about 1-2 nm.

Citation Download Citation

Oliver S. Heavens "Application of frustrated total reflection", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190746

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