Optical characterization and dimension determination of polyaniline films

Dang Mo; Yongyao Lin; Hui Z. Wang; Zhaoxian Yu

doi:10.1117/12.206860

24 April 1995 Optical characterization and dimension determination of polyaniline films

Dang Mo, Yongyao Lin, Hui Z. Wang, Zhaoxian Yu

Proceedings Volume 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices; (1995) https://doi.org/10.1117/12.206860
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

Ellipsometric spectra of insulating and conducting polyaniline films have been measured in the wave-length range of 300 nm - 800 nm. The dielectric function and the refractive index of various polyaniline films have been determined. Two absorption bands of the insulating polyaniline correspond to the interband transition and the exciton transition. More band structures in the spectrum of conducting polyaniline have been discussed and identified to the polaron transitions. The values of refractive index are between 1.31 and 1.64 for the insulating films, and between 1.37 and 1.57 for the high-conducting films. The nonlinear optical coefficient has been determined by the time-resolved absorption saturation measurement and the Z-scan measurement. The value of third order nonlinear susceptibility up to 3 X 10^-10 esu at 630 nm has been obtained. The dimensionality and the dimension crossover of these low-dimensional solids have also been studied.

Citation Download Citation

Dang Mo, Yongyao Lin, Hui Z. Wang, and Zhaoxian Yu "Optical characterization and dimension determination of polyaniline films", Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); https://doi.org/10.1117/12.206860

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