Practical method for evaluating the visibility of moire patterns for CRT design

Naoki Shiramatsu; Masashi Tanigawa; Shuji Iwata

doi:10.1117/12.207521

24 April 1995 Practical method for evaluating the visibility of moire patterns for CRT design

Naoki Shiramatsu, Masashi Tanigawa, Shuji Iwata

Proceedings Volume 2408, Liquid Crystal Materials, Devices, and Displays; (1995) https://doi.org/10.1117/12.207521
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

The high resolution CRT displays used for computer monitor and high performance TV often produce a pattern of bright and dark stripes on the screen called a moire pattern. The elimination of the moire is an important consideration in the CRT design. The objective of this study is to provide a practical method for estimating and evaluating a moire pattern considering the visibility by the human vision. On the basis of the mathematical model of a moire generation, precise value of the period and the intensity of a moire are calculated from the actual data of the electron beam profile and the transmittance distribution of apertures of the shadow mask. The visibility of the moire is evaluated by plotting the calculation results on the contrast-period plane, which consists of visible and invisible moire pattern regions based on experimental results of the psychological tests. Not only fundamental design parameters such as a shadow mask pitch and a scanning line pitch but also details of an electron beam profile such as a distortion or an asymmetry can be examined. In addition to the analysis, the image simulation of a moire using the image memory is also available.

Citation Download Citation

Naoki Shiramatsu, Masashi Tanigawa, and Shuji Iwata "Practical method for evaluating the visibility of moire patterns for CRT design", Proc. SPIE 2408, Liquid Crystal Materials, Devices, and Displays, (24 April 1995); https://doi.org/10.1117/12.207521

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