Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory

Michael D. Feit; Alexander M. Rubenchik; Bruce W. Shore; Brent C. Stuart; Michael D. Perry

doi:10.1117/12.213727

14 July 1995 Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory

Michael D. Feit, Alexander M. Rubenchik, Bruce W. Shore, Brent C. Stuart, Michael D. Perry

Proceedings Volume 2428, Laser-Induced Damage in Optical Materials: 1994; (1995) https://doi.org/10.1117/12.213727
Event: Laser-Induced Damage in Optical Materials: 1994, 1994, Boulder, CO, United States

Abstract

Our extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, (tau) , ranging from 275 fs to 1 ns are reported elsewhere at this meeting. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.

Citation Download Citation

Michael D. Feit, Alexander M. Rubenchik, Bruce W. Shore, Brent C. Stuart, and Michael D. Perry "Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory", Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); https://doi.org/10.1117/12.213727

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