Paper
7 July 1995 Electro-optical approach to pavement deflection management
Jeff W. Rish III, Avery D. Adcock, Christopher Y. Tuan, Samuel L. Baker, Hugh W. Welker II, Roger F. Johnson
Author Affiliations +
Abstract
A prototype continuous deflection device, referred to as a rolling weight deflectometer (RWD), has been developed as a nondestructive evaluation tool for airfield pavements. The system consists of a rigid trailer equipped with specially designed optical triangulation pavement sensors, a high-speed data acquisition system, and a high-pressure tire/load platform assembly. Pavement sensors are mounted on a rigid box beam equipped with an internal sensor system that corrects, in real time, the relative pavement height position measurements for displacements induced in the beam by mechanical vibrations, changes in temperature, or nonuniform dynamic loads at points where the beam attaches to the frame. The device produces continuous deflection profiles that show pavement response to a moving loaded wheel along the path of travel. These deflection profiles, combined with multiple passes along a lane, provide a far more detailed picture of the pavement structural integrity than has ever before been possible, because existing evaluation tools only produce response information at discrete points. Preliminary results show deflections measured by the RWD are in general agreement with the expected pavement response for various loads. A discussion of the device configuration, preliminary data, and potential as a pavement management tool is presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeff W. Rish III, Avery D. Adcock, Christopher Y. Tuan, Samuel L. Baker, Hugh W. Welker II, and Roger F. Johnson "Electro-optical approach to pavement deflection management", Proc. SPIE 2455, Nondestructive Evaluation of Aging Aircraft, Airports, Aerospace Hardware, and Materials, (7 July 1995); https://doi.org/10.1117/12.213552
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Sensors

Error analysis

Prototyping

Data acquisition

Nondestructive evaluation

Surface roughness

Computing systems

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