Empirical bidirectional reflectivity model

Mark A. Culpepper

doi:10.1117/12.210592

2 June 1995 Empirical bidirectional reflectivity model

Mark A. Culpepper

Proceedings Volume 2469, Targets and Backgrounds: Characterization and Representation; (1995) https://doi.org/10.1117/12.210592
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Several mathematical models for the bidirectional reflectivity distribution function (BRDF) are compared to plane-of-incidence (PLIN), BRDF measurements of opaque surfaces. A laser at 0.6328 micrometers wavelength was the source for the BRDF measurement instrument; the theoretical measurement accuracy was to within 2%. Data are given for a glossy white paint, a glossy black paint, and a mill finished aluminum. The goal was to find a BRDF model that can represent the measured data to within 10% for any incident/reflected angle. Neither the Lambertian, Phong, Harvey, nor Cook-Torrance models had the desired accuracy for the three samples. A method which is based on interpolation and extrapolation of the empirical data is proposed which may achieve the desired goal both in and out of the PLIN.

Citation Download Citation

Mark A. Culpepper "Empirical bidirectional reflectivity model", Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); https://doi.org/10.1117/12.210592

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