Systematic and accurate characterization of infrared detectors for strategic surveillance applications

Raymond K. Purvis; James R. Duffey

doi:10.1117/12.210557

30 May 1995 Systematic and accurate characterization of infrared detectors for strategic surveillance applications

Raymond K. Purvis, James R. Duffey

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210557
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Intelligent decisions on the selection of infrared Focal Plane Arrays for sensor systems can only be made if testing of the individual detectors/arrays is carried out in a systematic and accurate manner. Devices are often tested several months apart, in different locations and under varying radiation conditions. This paper discusses various experimental methods that can be used to insure that consistent, accurate results are obtained. Radiometric parameters must be carefully controlled. Blackbodies make excellent reproducible infrared sources when used correctly, as they can be calibrated with simple thermocouples. Selection of blackbody temperature for various wavelengths of interest is important since measurements in a poorly chosen spectral region can translate minor blackbody temperature fluctuations into large errors in detector photon flux. Design of Dewar geometry is extremely important for low background measurements, as large errors can occur due to unwanted reflections or light leaks. The physical dimension of any limiting apertures must be measured precisely. Filter characterization must be accomplished for each filter or window used at the temperature of interest. With care, systematic and accurate measurements, and hence valid comparisons, can be made between detectors measured at different sites and times.

Citation Download Citation

Raymond K. Purvis and James R. Duffey "Systematic and accurate characterization of infrared detectors for strategic surveillance applications", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210557

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