Active stabilization of ESPI systems for applications under rough conditions

Konstatin Galanulis; Thomas Bunkus; Reinhold Ritter

doi:10.1117/12.212635

23 June 1995 Active stabilization of ESPI systems for applications under rough conditions

Konstatin Galanulis, Thomas Bunkus, Reinhold Ritter

Proceedings Volume 2545, Interferometry VII: Applications; (1995) https://doi.org/10.1117/12.212635
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

A method for the active stabilization of an out-of-plane electronic speckle pattern interferometer (ESPI) is presented. A compact Michelson interferometer is adapted to the ESPI head to determine the relative motion between the ESPI and the object. The signal of the Michelson interferometer is prepared by a microcontroller and supplied as an addition signal to the phase shifting unit of the ESPI. The presented solution is a practical method for applications with real-time ESPI. It increases the potential of ESPI especially for applications outside of an optical laboratory under rough conditions.

Citation Download Citation

Konstatin Galanulis, Thomas Bunkus, and Reinhold Ritter "Active stabilization of ESPI systems for applications under rough conditions", Proc. SPIE 2545, Interferometry VII: Applications, (23 June 1995); https://doi.org/10.1117/12.212635

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