Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate

A. D. Leonetz; V. G. Kravetz; Andrey A. Kryuchin

doi:10.1117/12.226128

3 November 1995 Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate

A. D. Leonetz, V. G. Kravetz, Andrey A. Kryuchin

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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226128
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

For measurements of reflection factor of recording cover, deposited on internal surface of glass cylindrical tube, we designed and manufactured a stand. It permits us to conduct the measurement of reflection factor of recording cover of optical information carrier within a time of not more than 25 s. The measurement of reflection factor is conducted on an 0.83 mkm wavelength of semi-conductor infrared laser. We admit the measurement of reflection factor for samples on flat substrates.

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A. D. Leonetz, V. G. Kravetz, and Andrey A. Kryuchin "Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226128

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KEYWORDS

Reflection

Coating

Glasses

Optics manufacturing

Interfaces

Design for manufacturability

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